| S |
Sulfur |
| S.A |
Surface area; Subresolution assist; Structured analysis |
| S.A.A |
Static automated analysis |
| S.A.B |
Sensor/actuator bus |
| S.A.C.D |
Super Audio CD |
| S.A.D |
Selected Area Diffraction |
| S.A.E |
Society of Automotive Engineers |
| S.A.E.D |
Selected Area Electron Diffraction |
| S.A.G |
Self Aligned Gate |
| S.A.M |
Scanning Auger Microscopy |
| S.A.N |
Storage Area Network |
| S.A.N.S |
Small Angle Neutron Scattering |
| S.A.R |
Successive Approximation Register; Synthetic Aperture Radar |
| S.A.R.E |
Segmentation And Reassembly Element |
| S.A.S |
Suspended Air Stripline |
| S.A.S.E.R |
Sound Amplification by Stimulated Emission of Radiation. |
| S.A.T |
Spray acid tool |
| S.A.V.E |
SAARC Audio Visual Exchange. |
| S.A.W |
Surface-Acoustic Wave. |
| S.A.X |
Simple API for XML |
| S.A.X.S |
Small Angle X-ray Scattering |
| S.B |
Strong base ion exchange |
| S.B.C |
S Bus Circuit |
| S.B.C-X |
S Bus Circuit Extended |
| S.B.D |
Schottky Barrier Diode |
| S.B.L |
Scanned Beam Laminography |
| S.B.T |
Slender Body Theory |
| S.B.U |
Sequential build-up |
| S.C |
Semi-Conducting; Short Circuit |
| S.C.A |
Surface charge analysis |
| S.C.A.L.P.E.L |
Scattering with Angular Limitation in Projection Electron-beam
Lithography |
| S.C.A.R.T |
European connector definition for TVs and VCRs |
| S.C.B.A |
Self-contained breathing apparatus |
| S.C.C |
Strategic cell controller |
| S.C.C.O.S |
Secure Chip Card Operating System. |
| S.C.C.S |
Source code control system |
| S.C.E |
Saturated calomel electrode |
| S.C.F |
Super critical fluid |
| S.C.I |
Surface charge imaging |
| S.C.I.C |
Semiconductor integrated circuit |
| S.C.K |
Smart Commercial Kitchen. |
| S.C.M |
Scanning capacitance microscopy |
| S.C.N.T |
Single Chip Network Termination |
| S.C.O.S.T.A |
Smart Card Operating System for Transport Application. |
| S.C.P |
Single chip package |
| S.C.R |
Silicon controlled rectifier |
| S.C.S |
Single Crystal Silicon |
| S.C.S.I |
Small Computer Systems Interface. |
| S.C.T |
SciTex continuous tone image format |
| S.C.T.E |
Society of Telecommunications Engineers |
| S.C.U |
Satellite Communication Unit. |
| S.C1 |
Standard Clean 1 |
| S.C2 |
Standard Clean 2 |
| S.D |
Small dual in-line package; structured design; single density |
| S.D.A.R.S |
Satellite Digital Audio Radio System. |
| S.D.F.L |
Schottky-diode FET logic |
| S.D.H |
Synchronous Digital Hierarchy |
| S.D.H.T |
Selectively Doped Heterojunction Transistor; SDH/SONET Transceiver |
| S.D.I |
Serial Data Interface. |
| S.D.I |
Serial Digital Interface. |
| S.D.L.C |
Synchronous data link control |
| S.D.L.T.S |
Scanning Deep-Level Transient Spectroscopy |
| S.D.M |
Specific Device Model for SAB |
| S.D.M.I |
Secure Digital Music Initiative |
| S.D.R |
Software Defined Radio |
| S.D.R.A.M |
Synchronous Dynamic Random Access Memory |
| S.D.S |
Smart distributed system |
| S.D.S.I |
Synchronous data-link control |
| S.E |
Spectroscopic ellipsometry; secondary electron; Seed End; Surface
Element |
| S.E |
Spreading Efficiency. |
| S.E.A.J |
Semiconductor Equipment Association of Japan |
| S.E.C |
Size exclusion chromatography; Solvent extract conductivity |
| S.E.C.A.M |
Sequence Electronique Couleur Avec Memoire (Electronic Colour Sequence
with Memory) |
| S.E.C.S |
Semiconductor Equipment Communications Standard |
| S.E.D.O.R |
Spin Echo DOuble Resonance |
| S.E.G |
Selective epitaxial growth |
| S.E.I.M |
Software engineering improvement method |
| S.E.L |
Surface Emitting Laser |
| S.E.M |
Scanning Electron Microscopy; Specific Equipment Model; Standard
Electronic Module |
| S.E.M.I |
Semiconductor Equipment and Materials International |
| S.E.M.I.S.P.I.N |
Semiconductor Software Process Improvement Network |
| S.E.P |
Software engineering process |
| S.E.P.G |
Software Engineering Process Group |
| S.E.Q.D.B |
Semiconductor Equipment Database |
| S.E.R.A |
Sequential Electrochemical Reduction Analysis |
| S.E.R.D.E.S |
Serialization/Deserialization |
| S.E.S |
Secondary Electron Spectroscopy |
| S.E.T |
Single Electron Tunneling/TransPort |
| S.E.T.E.C |
Semiconductor Equipment Technology Center |
| S.E.X.A.F.S |
Surface Extended X-ray Absorption Fine Structure |
| S.F |
Super Fluorescence |
| S.F.B |
Symmetry Breaking Force |
| S.F.C |
Supercritical fluid chromatography |
| S.F.D |
Stacking Fault Density |
| S.F.D.R |
Spurious Free Dynamic Range |
| S.F.G |
Sum Frequency Generation |
| S.F.M |
Surface feet per minute |
| S.F.T.P.S |
Secure File Transfer Protocol |
| S.G.M.L |
Standard Generalized Markup Language |
| S.G.M.M |
Semiconductor Generic Manufacturing Model |
| S.G.M.R.S |
Semiconductor Generic Manufacturing Requirements Specification |
| S.G.R.A.M |
Synchronous Graphics Random Access Memory |
| S.G.V |
Scalable Vector Graphics |
| S.H.A |
Secure Hash Algorithm |
| S.H.A.C |
Simple Hands-free Add-on Circuit |
| S.H.A.R.C |
Super Harvard Architecture Computer |
| S.H.F |
Super high frequency |
| S.H.F |
Super HyperFine (interaction) |
| S.H.G |
Second Harmonic Generation |
| S.I |
Semi-Insulating; Service Information |
| S.I.A |
Semiconductor Industry Association |
| S.I.C.A.T |
Siemens Concept Analog Telephone |
| S.I.C.O.F.I |
Signalling Codec Filter |
| S.I.D.P |
Sputter ion depth profiling |
| S.I.L |
Systems Integration Lab |
| S.I.M |
Subscriber Identity Module. |
| S.I.M.O |
Single Input Multiple Output. |
| S.I.M.O.X |
Separation by implantation of oxygen |
| S.I.M.S |
Secondary Ion Mass Spectroscopy |
| S.I.O |
Serial Input Output |
| S.I.O.A |
Surface Induced Optical Anisotropy |
| S.I.P |
Silicon Intellectual Property. |
| S.I.P |
Single in-line package |
| S.I.P |
Session Initiation Protocol |
| S.I.P |
Single in-line package |
| S.I.P.O |
Serial In Parallel output |
| S.I.R |
Surface Insulation Resistance |
| S.I.R.I.J |
Semiconductor Industry Research Institute of Japan |
| S.I.S.F.E.T |
Semiconductor-Insulator-Semiconductor FET |
| S.I.S.O |
Serial in serial out |
| S.I.S.O |
Single Input Single Output. |
| S.I.T |
Static Induction Transistor, System Interface Test |
| S.I.V |
Sensors in vacuum |
| S.L |
Specification limit; Super lattice |
| S.L.A.C |
Subscriber Line Audio processing interface |
| S.L.A.M |
Scanning laser acoustic microscopy |
| S.L.C |
Surface Laminar Circuit; Single Layer Cap |
| S.L.E.E.D |
Spin-Polarized Low Energy Electron Diffraction |
| S.L.I.C |
Standard-function Linear Integrated Circuit; Subscriber Line Interface
Circuit |
| S.L.I.C.O.F.I |
Subscriber Line Interface Circuit and Signaling Codec Filter |
| S.L.M |
Spatial Light Modulator |
| S.L.O.C |
Source lines of code |
| S.L.P.S.S |
Semiconductor Laser Pumped Solid State |
| S.L.S.I |
Super large scale integration |
| S.L.V |
Satellite Launch Vehicle. |
| S.M |
Stress migration; Surface mount |
| S.M.A |
Shape Memory Alloy; Surface Mount Assembly; Sub-Miniature type A |
| S.M.B |
Single-mask bumping |
| S.M.C |
Surface-mounted components |
| S.M.D |
Surface Mount Devices |
| S.M.E |
Subject matter expert; Software maintenance engineer |
| S.M.E.M.A |
Surface Mount Equipment Manufacturers Association |
| S.M.G |
Screen management guide |
| S.M.I.D |
Single Instruction Multiple Data |
| S.M.I.F |
Standard mechanical interface |
| S.M.I.L |
Synchronized Multi-media Integration Language |
| S.M.O.B.C |
Solder mask over bare copper |
| S.M.P.M |
SECS message protocol machine |
| S.M.P.T.E |
Society of Motion Picture and Television Engineers |
| S.M.R |
Semiconductor mask representation |
| S.M.S |
SECS message service; Short Messaging Service |
| S.M.S.C |
Short Message Switching Center |
| S.M.T |
Surface Mount Technology. |
| S.M.T.A |
Surface Mount Technology Association. |
| S.M.T.P |
Simple Mail Transfer Protocol. |
| S.M.T.S |
Strategic Material Transport System |
| S.N.A |
System Network Architechture. |
| S.N.A |
Scalar Network Analyzer |
| S.N.M.P |
Simple Network Management Protocol. |
| S.N.M.S |
Sputtered neutral mass spectroscopy |
| S.N.O.M |
Scanning nearfield optical microscopy |
| S.N.R |
Signal-to-noise ratio |
| S.O |
Small outline (package) |
| S.O.A.P |
Simple Object Access Protocol |
| S.O.C |
System on (a) Chip |
| S.o.C |
System on Chip. |
| S.O.D |
Spin-On-Dielectric; Silicon On Diamond; Small Outline Diode; Source
Over Drain |
| S.O.D.I.M.M |
Small Outline Dual-In-line Memory Module |
| S.O.G |
Spin-On Glass; Source Over Gate |
| S.O.H.O |
Small Office Home Office. |
| S.O.I |
Silicon On Insulator; Second Order Intercept |
| S.O.I.C |
Small Outline IC |
| S.O.L.T |
Short Open Load Through |
| S.O.M |
Scanning Optical Microscopy |
| S.O.N.E.T |
Synchronous Optical NETwork |
| S.O.P |
Standard operating procedure; Small outline package |
| S.o.P.C |
System on Programmable Chip. |
| S.O.S |
Silicon on sapphire |
| S.O.T |
Small Outline Transistor |
| S.O.W |
Statement Of Work |
| S.P |
Simple Profile |
| S.P.3.T |
Single Pole Triple Throw |
| S.P.A-L.E.E.D |
Spot Profile Analysis Low Energy Electron Diffraction |
| S.P.C |
Statistical process control; Surface Photoconductivity |
| S.P.D.E |
Service Provider Delivery Environment |
| S.P.D.T |
Single pole double throw |
| S.P.E.G |
Solid Phase Epitaxy Growth |
| S.P.G.A |
Staggered Pin Grid Array; System Programmable Gate Array |
| S.P.I |
Software Process Improvement; Serial-peripheral interface protocol |
| S.P.I.C.E |
Simulation program with integrated circuit emphasis |
| S.P.I.D.E.R-M.E.M |
SPIDER-Manufacturing Equipment Monitor |
| S.P.I.N |
Software Process Improvement Network |
| S.P.L.D |
Simple Programmable Logic Device |
| S.P.L.I.C.S |
Special-Purpose Linear Integrated Circuits |
| S.P.M |
Scanning probe microscopy |
| S.P.P |
Single-phase printing |
| S.P.R |
Semiconductor process representation |
| S.P.S.T |
Single Pole, Single Throw |
| S.P.T |
Shortest processing time |
| S.P.T.M |
Self Printing Ticketing Machine. |
| S.P.T.S |
Simple Program Transport Stream |
| S.P.V |
Surface Photovoltage Spectroscopy |
| S.P.X |
Sequential Packet Exchange. |
| S.Q.C |
Statistical quality control |
| S.Q.L |
Structured Query Language |
| S.Q.M |
System Quality Manager |
| S.Q.P.M.M |
Software Quality and Process Maturity Model |
| S.Q.U.I.D |
Super conducting QUantum Interference Device |
| S.R |
Shift register |
| S.R.A.C |
Supplier Relations Action Council |
| S.R.A.M |
Static Random Access Memory. |
| S.R.C |
Semiconductor Research Corporation |
| S.R.P |
Spreading resistance probe |
| S.R.P.T |
Shortest remaining processing time |
| S.R.S |
Software requirements specification |
| S.S |
Single Sided; Small Signal |
| S.S.A |
Semiconductor Industry Association |
| S.S.B |
Single sideband |
| S.S.C |
Standard Speech Circuit |
| S.S.E |
Sum squared error |
| S.S.E.M |
Stepper Specific Equipment Model |
| S.S.F.D.C |
Solid-State Floppy-Disk Card |
| S.S.G |
Small Signal Gain |
| S.S.H |
Secure SHell |
| S.S.I |
Small scale integration |
| S.S.L |
Secure Socket Layer. |
| S.S.M |
Strategic Sourcing Methodology |
| S.S.M.A |
Sub-SMA |
| S.S.O.P |
Shrink Small Outline Package |
| S.S.P.A |
Solid State Power Amplifier |
| S.S.Q.A |
Standardized Supplier Quality Assessment |
| S.S.R |
Static Shift Register; Solid State Relay |
| S.S.R.A.M |
Synchronous (cache) Static Ramdom Access Memory |
| S.S.W |
Seismic Surface Wave. |
| S.T.A.F |
SDH Transceiver And Framer |
| S.T.A.L.O |
STAble Local Oscillator |
| S.T.A.R |
Simultaneous transmitted and reflected |
| S.T.B |
Set Top Box. |
| S.T.D |
Subscribers Trunk Dialling. |
| S.T.E |
Special Test Equipment |
| S.T.E.L |
Short-term exposure limit |
| S.T.E.M |
Scanning Transmission Electron Microscopy |
| S.T.E.P |
Standard for Exchange of Product Model Data |
| S.T.H.M |
Scanning Thermal Microscope |
| S.T.I |
Shallow Trench Isolation |
| S.T.L |
Schottky Transistor Logic |
| S.T.M |
Scanning Tunneling Microscopy |
| S.T.P |
Software Technology Park. |
| S.T.P |
Standard Temperature and Pressure; System Test Plan; Shielded Twisted
Pair |
| S.U |
Subresolution attenuated |
| S.U.T |
System under test |
| S.U.V |
Small Unit Verification |
| S.V.D |
Singular value decomposition |
| S.V.G |
Scalable Vector Graphic |
| S.W |
Short wave |
| S.W.A.T |
Software Action Team |
| S.W.E.A.T |
Standard wafer-level electromigration accelerated test |
| S.W.I |
Static walkthrough/inspection |
| S.W.I.M |
Semiconductor Workbench for Integrated Modeling |
| S.W.P |
Single Wafer Processing |
| S.W.R |
Semiconductor Wafer Representation |
| S.W.R |
Standing Wave Ratio. |
| S.W.V |
Square Wave Voltammetry |
| S.X.P.S |
Soft X-ray Photoelectron Spectroscopy |
| S/A |
Sensor/actuator |
| S/D |
Source/drain |
| S/N |
Serial number |
| S/N |
Signal to Noise Ratio |
| S/P.D.I.F |
Sony/Philips Digital Interface |
| Si |
Silicon |
| SiGe |
Silicon Germanium |
| SLIP |
Single Line Internet Protocol |
| S-M.I.M.E |
Secure MIME |
| Sn |
Tin |
| SportsML |
Sports Mark-up Language |
| sq cm |
Square centimeter |
| SYNC |
Synchronous |